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Malvern Panalytical

Malvern Panalytical was formed by the merger of Malvern Instruments Limited and PANalytical B.V. on 1st January 2017, has headquarters in both Almelo (the Netherlands), and in Malvern (UK), and employs over 2,000 people worldwide. The combined entity is a strong player and innovator in the materials characterization market and will leverage the strengths of the individual companies in their end markets, ranging from building materials to pharmaceuticals and from metals and mining to nanomaterials.

Malvern Panalytical – We’re BIG on small


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Success Story

 

Malvern Panalytical Becomes Market Leader In Southeast Asia

Malvern Panalytical worked with DKSH to develop an effective market expansion strategy to help boost its brand in Southeast Asia.

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Showing 13–16 of 23 results

  • Malvern Panalytical - Spectroscopy - Axios Fast

    Malvern Panalytical – Spectroscopy – Axios Fast

    Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the PANalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high uptime go hand in hand with a low cost of ownership.  

    With analysis results being available in just a few seconds, the Axios FAST elemental analyzer is the ideal tool for time-critical applications and high sample throughput analysis environments. Main application areas include steel and metals alloy production as well as geological or commercial laboratories where hundreds of samples need to be analyzed every day.  

    DKSH is the exclusive distributor in Cambodia, Laos, Malaysia, Myanmar, Philippines, Thailand and Vietnam.

  • Malvern Panalytical - Spectroscopy - Zetium

    Malvern Panalytical – Spectroscopy – Zetium

    X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium spectrometer leads the market in high-quality design and innovative features for sub ppm to percentage analysis of Be to Am.

    Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in materials analysis. The platform embodies SumXcore technology – an integration of WDXRF, EDXRF and XRD. This unique combination of possibilities puts Zetium in a class of its own with respect to analytical power, speed and task flexibility in multiple environments.

    DKSH is the exclusive distributor in Cambodia, Laos, Malaysia, Myanmar, Philippines, Thailand and Vietnam.

  • Malvern Panalytical - Viscometry & Rheometry - DSR

    Malvern Panalytical – Viscometry & Rheometry – DSR

    Market proven worldwide, the Malvern DSR dynamic shear rheometer has been specifically designed to satisfy the demands of high throughput grade testing of Asphalt binders (bitumen), to AASHTO (American Association of State Highway and Transportation Officials) industry standards.

    DKSH is the exclusive distributor in Cambodia, Indonesia, Laos, Malaysia, Myanmar, Philippines, Singapore, Taiwan, Thailand and Vietnam.

  • Malvern Panalytical - X-Ray Diffractometer (XRD) - X'Pert³ Powder

    Malvern Panalytical – X-Ray Diffractometer (XRD) – X’Pert³ Powder

    The next generation cost-effective, multipurpose X-ray diffraction platform

    X’Pert³ Powder is PANalytical’s newest X-ray diffraction system based on the fully renewed X’Pert platform. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X’Pert³ Powder is ready for the future. The system offers an affordable solution for high-throughput, high-quality phase identification and quantification, residual stress analysis, grazing incidence diffraction, X-ray reflectometry, small-angle X-ray scattering, pair distribution function analysis and non-ambient diffraction.

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